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Products - Solution C-BC
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The TME Solution-C-BC Blister Card Test System produces quantitative results in non-destructive, pressure or vacuum decay leak testing of blister cards. The test instrument provides all the features of the high-resolution, technologically advanced TME Solution-C test instrument, and the customized test chambers accommodate your specific product. Interchangeable fixture inserts can be provided to accommodate a variety of sizes and shapes, and a gross leak detector is built in to detect open or broken seals. |
TME Solution-C-BC Non-Destructively Tests Blister Cards using either Pressure or Vacuum Decay |
 Interchangeable fixture inserts are custom designed and manufactured using a proprietary technique that maximizes the sensitivity of the test on your particular blister cards.
- The high resolution (0.0001psi or 0.01 mbar/second) TME Solution-C detects holes as small as 5 microns
- Highly repeatable, quantitative results from non-destructive vacuum or pressure decay leak testing of blister cards, avoiding the loss of good product through testing
- A variety of units of measure are available including PSI, InH2O, kPa, and mbar. CFR Part 11 Data Protection is standard in the TME Solution-C instrument, and calibration is NIST traceable
- Two way RS232 computer connection is standard for data collection and remote parameter control; Ethernet connectivity is available to allow data to be transmitted from the instrument to a LAN.
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TM Electronics, Inc.
45
Main Street , Boylston, MA 01505
Tel: (508) 869-6400 | Toll Free: (800) 370-0501 | Fax: (508) 869-9955
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