Custom Chamber Fixtures enable Non-Destructive Package Testing

Boylston, MA: TM Electronics, Inc. provides custom designed non-destructive test systems for non-porous packages or medical devices. The TME Solution-C test system produces quantitative test results from products that cannot be accessed to pressurize through an access port, as well as sealed, flexible medical and pharmaceutical packages. By combining the sensitivity of pressure or vacuum decay leak testing with the simplicity of sealed fixtures, the TME Solution-C system can detect holes as small as 5 microns. This highly sensitive method uses a proprietary chamber design to find leaks in product seals or walls and seals of common package materials such as films, foils and laminates, and is amenable to leak testing induction welded bottle seals and blister cards as well.

The TME Solution-C test instrument has real time statistical analysis accessible on demand, including quality control charts for proactive process control. Two way RS232 Computer Connection is standard for data collection and remote parameter control; Ethernet connectivity is available to allow data to be transmitted from the instrument to a LAN. The TME Solution-C conforms to ASTM guidelines and provides CFR Part 11 Data Protection. Calibration is NIST traceable.

Test fixtures are custom designed and manufactured to maximize the sensitivity of the test on your particular product or package.  Interchangeable fixture inserts enable your test system to accommodate a variety of package sizes.

The TME Solution-C non-destructive leak test system provides highly repeatable, quantitative results from non-destructive vacuum or pressure decay leak testing, avoiding the loss of good product through testing.