Non-Destructive or Vacuum Decay Test Systems | Leak & Leak Flow Tester Systems | TM Electronics

Leak & Leak Flow Tester Systems

Non-Destructive or Vacuum Decay Test Systems

 

TME Solution-C

Non-Destructive Chamber Pressure or Vacuum Decay Test System

TM Electronics Solution-C
  • Non-destructive pressure or vacuum leak testing – reclaim good product
  • Detect holes as small as 5 microns in sealed products or non-porous packages
  • Test chambers customized to your product or package
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TME Solution-CB

Non-Destructive Test System for Induction Welded Seals

TM Electronics Solution-CB
  • All the features of the TME Solution
  • Pharmaceutical, nutriceutical and food bottles regardless of shape or size
  • Interchangeable fixture inserts to accommodate varying bottle sizes
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TME Solution-C-BC

Non-Destructive Test System for Blister Cards

TM Electronics Solution-C-BC Blister Cards
  • All the features of the TME Solution
  • Customized test chambers to accommodate your particular needs
  • Interchangeable fixture inserts for a variety of sizes and shapes
  • Gross leak detector built in to detect open or broken seals
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Non-Destructive or Vacuum Decay Test Systems | Leak & Leak Flow Tester Systems | TM Electronics
leak flow test systems, leak test systems, flow test systems, non destructive chamber pressure systems, vacuum decay test systems
TM Electronics (TME) offers a full line of non-destructive or vacuum decay test systems that utilize innovative technology to deliver reliable, repeatable solutions to leak testing challenges. Call @ 1-800-370-0501 or Email:sales@tmelectronics.com.