TM Electronics will be demonstrating leak and package testing systems at the MD&M-East 2009 Show on June 9-11, 2009, at the Javits Center in New York City. We will be featuring the TME Solution-C Pressure or Vacuum Chamber Test System for non-destructive testing of flexible, non-porous medical packaging. Also featured are the TME Solution Multi-Port Leak/Flow Tester for sensitive, high-resolution leak and flow testing of a variety of devices and packages.
Visit us at Booth 2024.